Characterization of MAPLE deposited WO3 thin films for electrochromic applications

Characterization of MAPLE deposited WO3 thin films for electrochromic applications

Publication Type:

Book Chapter

Source:

Inera Workshop 2016: Membrane and Liquid Crystal Nanostructures, Volume 780 (2017)

Abstract:

<p>Tungsten trioxide (WO3) is a widely studied material for electrochromic applications. The structure, morphology and optical properties of WO3 thin films, grown by matrix assisted pulsed laser evaporation (MAPLE) from monoclinic WO3 nano-sized particles, were investigated for their possible application as electrochromic layers. A KrF* excimer (lambda = 248 nm, .zeta(FWHM)=25 ns) laser source was used in all experiments. The MAPLE deposited WO3 thin films were studied by atomic force microscopy (AFM), grazing incidence X-ray diffraction (GIXRD) and Fourier transform infrared spectroscopy (FTIR). Cyclic voltammetry measurements were also performed, and the coloring and bleaching were observed. The morpho-structural investigations disclosed the synthesis of single-phase monoclinic WO3 films consisting of crystalline nano-grains embedded in an amorphous matrix. All thin films showed good electrochromic properties, thus validating application of the MAPLE deposition technique for the further development of electrochromic devices.</p>